The Organizing Committee of the 2023 Atom Probe Tomography & Microscopy would like to invite you to submit an abstract for the meeting. The Program Committee will allocate the submitted abstracts to either oral or poster presentations (the authors will be informed by the mid-June). All contributions should be presented during the conference by a registered presenting author.
The deadline for abstract submission is extended until Tuesday May 9th, 2023 – 23:59 CET.
The abstract title, the authors (in correct order) and their affiliation should be entered in the corresponding fields in the abstract submission portal of APT&M 2023. Please make sure that all names and affiliations are correctly linked. Corresponding and presenting author should be clearly indicated. We kindly ask the authors to select the conference topic which is most closely linked to their contribution.
An abstract up to 350 words (including references) should be submitted via the online system of the conference. Figures cannot be included in the abstract. In the presenter information section, the preferred type of presentation (oral or poster) can be indicated. However, it is up to the Organizing Committee to make the final selection of oral presentations (the authors will be informed by the mid-June).
For submitting your abstract, please visit our online platform by clicking HERE. First, create your personal account, after which an email will be send to activate your account. Please check your spam folder. You can submit or manage your abstracts in your personal dashboard.
Topics for submission:
- Fundamental aspects in APT, Laser-Matter Interaction, high-field Nanoscience, Field Ion Microscopy, Simulations
- Technical Advances in Specimen Preparation and (cryo) Transfer, Instrumentation, Workflow Automation
- Advances in data reconstruction & data analysis, Machine learning Approaches, Simulation Tools, Open Software
- Quantification in APT, Interlaboratory Studies, Calibration, Standards
- Correlative Atom Probe Tomography (TEM, SPM, XPS, PL, SIMS …)
- Nano-scale characterization of
- Metals and Alloys
- Functional materials, Battery materials, Ceramics, Oxides
- Semiconductor Materials and Devices
- Nuclear and Radioactive Materials
- Geological and Planetary Materials
- Biological and Organic Materials, Frozen Liquids, Soft Matter
- Advances in Hydrogen detection